QLTR300 is an online thermal resistance testing device suitable for semiconductor devices and heat dissipation systems. It uses internationally leading transient temperature measurement technology and structural function method principles to achieve non-destructive testing of the thermal resistance of multilayer structures in semiconductor devices. It features fast measurement speed, high testing accuracy, nondestructive testing, and a wide range of measurement targets.
·Employs an electrical method to obtain the temperature rise and thermal resistance values of each material layer in the thermal path by measuring the transient junction temperature changes (structural function).
·Supports a wide range of measurement targets,including Diode,LED,LD,BJT,IGBT, HEMT,VDMOS,SIC MOSFET,etc.,with the ability to provide"one-on one"customized services for specific user applications.
·User-friendly interface with automated measurement process;uses an innovative
dynamic temperature coefficient measurement method,increasing measurement speed by more than 10 times compared to tradtional methods;high accuracy,non-destructive to the tested devices;certified by third-party.
·Complies withJEDEC JESD51-1,GB/T 4023-1997,MILSTD-750 and other domestic and intenational standards.
